发明名称 Method for forming localized halo implant regions
摘要 A method for forming a localized halo implant region, comprises: implanting a first dosage of ions of a first type toward a surface of a substrate having a gate electrode formed thereon, so as to form a lightly doped region adjacent to the gate electrode; forming a disposable spacer on a sidewall of the gate electrode; forming an elevated source/drain structure adjacent to the disposable spacer; implanting a second dosage of ions of the first type toward the surface of the substrate so as to form a heavily doped region adjacent to the disposable spacer; removing the disposable spacer; and tilt-angle implanting at least one dosage of ions of a second type toward a gap created by the disposable spacer having been removed so as to form a localized halo implant region in the substrate, preferably by utilizing shadow effects of the gate electrode and the elevated source/drain structure.
申请公布号 US6518135(B1) 申请公布日期 2003.02.11
申请号 US20010961484 申请日期 2001.09.24
申请人 INTEGRATED DEVICE TECHNOLOGY, INC. 发明人 AHN JAE-GYUNG
分类号 H01L21/265;H01L21/336;(IPC1-7):H01L21/336 主分类号 H01L21/265
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