| 摘要 |
PURPOSE: An integrated circuit and a test method thereof are provided to perform a built-in-self-test using an embedded memory and processor in an ASIC(Application Specific Integrated Circuit). CONSTITUTION: An ASIC(100) includes a processing core(110), an internal memory(120), a GPIO(General Purpose Input/Output) interface(130) and functional units including a codec(140), an external device interface(150), a print engine communications unit(160), a DMA unit(170), and timing circuits(180). An arbitrated internal bus(190) conducts communication signals among the various blocks of ASIC(100). Processing core(110) executes instructions that are stored in internal memory(120) or external memory. Internal memory(120) includes volatile memory such as DRAM(122) and SRAM(124) and non-volatile memory such as ROM(126). The ROM(126) is a non-volatile memory such as a mask ROM, an EPROM, or an EEPROM and stores firmware. GPIO interface(130) provides the control and output interface for self-test functions of ASIC(100). |
