| 发明名称 |
Diagnosis of RAMS using functional patterns |
| 摘要 |
A methodology for testing embedded memories based on functional patterns that allow for easy and complete diagnosis including techniques for shortening the size of the array test, and/or the simulation turn around time, without diminishing the diagnostic accuracy.
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| 申请公布号 |
US6519725(B1) |
申请公布日期 |
2003.02.11 |
| 申请号 |
US19970811605 |
申请日期 |
1997.03.04 |
| 申请人 |
INTERNATIONAL BUSINESS MACHINES CORPORATION |
发明人 |
HUISMAN LEENDERT M.;LAI YA-CHIEH |
| 分类号 |
G11C29/10;G11C29/14;(IPC1-7):G11C29/00 |
主分类号 |
G11C29/10 |
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