发明名称 Exposure apparatus and device manufacturing apparatus and method
摘要 An exposure apparatus includes a projection optical system for projecting a pattern onto a substrate, a detector for detecting information relating to at least one of a plurality of optical characteristics of the projection optical system, a storage unit for storing information regarding a relationship between the at least one of the optical characteristics and at least another one of the optical characteristics and an extraction unit for extracting control data for the at least another one of the optical characteristics on the basis of information detected by the detector and storage information stored by the storage unit.
申请公布号 US6519024(B2) 申请公布日期 2003.02.11
申请号 US20010813168 申请日期 2001.03.21
申请人 CANON KABUSHIKI KAISHA 发明人 HIRANO SHINICHI
分类号 G03F7/20;H01L21/027;(IPC1-7):G03B27/52;G03B27/42;G01B11/00 主分类号 G03F7/20
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