发明名称 Plasma reactor using inductive RF coupling, and processes
摘要 A domed plasma reactor chamber uses an antenna driven by RF energy (LF, MF, or VHF) which is inductively coupled inside the reactor dome. The antenna generates a high density, low energy plasma inside the chamber for etching metals, dielectrics and semiconductor materials. Auxiliary RF bias energy applied to the 10 wafer support cathode controls the cathode sheath voltage and controls the ion energy independent of density. Various magnetic and voltage processing enhancement techniques are disclosed, along with etch processes deposition processes and combined etch/deposition processed. The disclosed invention provides processing of sensitive devices without damage and without microloading, thus providing increased yields.
申请公布号 US6518195(B1) 申请公布日期 2003.02.11
申请号 US20000504312 申请日期 2000.02.15
申请人 APPLIED MATERIALS, INC. 发明人 COLLINS KENNETH S.;YANG CHAN-LON;WONG JERRY YUEN-KUI;MARKS JEFFREY;KESWICK PETER R.;GROECHEL DAVID W.;RODERICK CRAIG A.;TROW JOHN R.;ISHIKAWA TETSUYA;PINSON, II JAY D.;LEI LAWRENCE CHANG-LAI;TOSHIMA MASATO M.;YIN GERALD ZHEYAO
分类号 C23C16/507;C23C16/517;H01L21/311;H01L21/683;(IPC1-7):H01L21/306 主分类号 C23C16/507
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