| 摘要 |
FIELD: integrated circuits testing. SUBSTANCE: device for realization of method has functional unit, digital logic circuit, data register, instruction register, sampling circuit. Method includes following operations: selective disconnection of supply of one of assemblage of output signals from integrated circuit, direction of test output signal from functional unit to first outer pin lead-out of integrated circuit for execution of testing operation by functional unit. EFFECT: reduced dimensions of printed circuit board and manufacturing cost of integrated circuit. 8 cl, 4 dwg
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