发明名称 SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME
摘要 <p>PROBLEM TO BE SOLVED: To provide a semiconductor device having fine pads at fine intervals, and a method for manufacturing the same. SOLUTION: The method for manufacturing the semiconductor device comprises a process for forming an opening 2 in the interlayer insulation film 1 on a semiconductor substrate, a process for forming a metal film 6 in the opening 2, a process for forming passivation layers 7, 8 on the metal film 6 and the interlayer insulation film 1, a process for exposing the upper surface of the metal film 6 by arranging an opening 9 in the passivation layers 7, 8, a process for forming a low melting point metal film 10 on the exposed upper surface of the metal film 6 and the upper surface of the passivation layers 7, 8, and a process for agglutinating the low melting point metal film 10 on the metal film 6 by heating at a higher temperature than the melting point of the low melting point metal film 10.</p>
申请公布号 JP2003037126(A) 申请公布日期 2003.02.07
申请号 JP20010222440 申请日期 2001.07.24
申请人 TOSHIBA CORP 发明人 TOYODA HIROSHI;HASUNUMA MASAHIKO;KANEKO HISAFUMI
分类号 H01L23/52;H01L21/3205;H01L21/60;(IPC1-7):H01L21/60;H01L21/320 主分类号 H01L23/52
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