发明名称 SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREFOR
摘要 PROBLEM TO BE SOLVED: To reduce the size of silicon crystal pastilles at crystallization of amorphous silicon, to which impurities to be acceptors are introduced. SOLUTION: A manufacturing method for a semiconductor device is provided with the process of forming the amorphous silicon on a gate insulating film, the process of introducing acceptor impurities to be the acceptors and crystal growth suppression impurities suppressing the growth of the crystal to the amorphous silicon and the process of crystallizing the amorphous silicon and forming p-type polycrystalline silicon.
申请公布号 JP2003037266(A) 申请公布日期 2003.02.07
申请号 JP20010224857 申请日期 2001.07.25
申请人 TOSHIBA CORP 发明人 AKASAKA YASUSHI;SUGURO KYOICHI
分类号 H01L21/28;H01L29/423;H01L29/43;H01L29/49;H01L29/78;(IPC1-7):H01L29/78 主分类号 H01L21/28
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