发明名称 RESIDUAL STRESS INSPECTION DEVICE FOR LIGHT PERVIOUS SUBSTANCE
摘要 PROBLEM TO BE SOLVED: To provide a residual stress inspection device for a light pervious substance dispensing with the rotation of an analyzer and capable of inspecting residual stress at a high speed. SOLUTION: Red, green and blue linearly polarized lights, which are passed through three polarizers 27, 28 and 29 arranged in different polarizing directions, are transmitted through an object 32 to be inspected and the analyzer 30. These red, green and blue lights are detected by a color CCD camera 31 and the polarizing characteristics of the object 32 to be inspected are calculated from the intensities of the respective color lights.
申请公布号 JP2003035613(A) 申请公布日期 2003.02.07
申请号 JP20010220892 申请日期 2001.07.23
申请人 OMRON CORP 发明人 KAWAMURA SHINICHIRO;NAGASAKA SHOGO
分类号 G01L1/00;G01B11/16;G02B5/30;(IPC1-7):G01L1/00 主分类号 G01L1/00
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