发明名称 METHOD AND APPARATUS FOR MEASUREMENT OF INFRARED ABSORPTION SPECTRUM BY ATTENUATED TOTAL REFLECTION METHOD
摘要 <p>PROBLEM TO BE SOLVED: To disclose a method and an apparatus for the measurement of an infrared absorption spectrum wherein not only a liquid or semisolid substance but also a solid substance untransferable to an island-shaped metal film can be measured with high sensitivity. SOLUTION: In the measuring method for the infrared absorption spectrum on the surface of a material to be measured, the surface of the material to be measured is bonded to a prism for attenuated total reflection measurement in which the island-shaped metal film is formed on a side on which the material to be measured is arranged, a pressure is applied periodically from its rear side, a modulating signal due to a surface enhanced infrared absorption responding to a change in a strong bond or a weak bond is taken out, and the modulating signal is demodulated by a lock-in amplifier or the like.</p>
申请公布号 JP2003035661(A) 申请公布日期 2003.02.07
申请号 JP20010221303 申请日期 2001.07.23
申请人 KONICA CORP 发明人 NISHIKAWA YUJI
分类号 G01N21/27;G01N21/35;G01N21/552;(IPC1-7):G01N21/27 主分类号 G01N21/27
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