发明名称 SUBSTRATE PROCESSING APPARATUS AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a substrate processing apparatus and a method of manufacturing semiconductor devices capable of actively controlling and managing a surface condition of an internal wall in piping for supplying a raw gas, prior to and after the supply thereof. SOLUTION: The apparatus is comprised of a reaction chamber 8 for processing substrates, an evaporator 7 for evaporating a liquid raw material, and a supply piping 11 for supplying an evaporated gas in the evaporator 7 to the reaction chamber 8. The supply piping 11 is provided with an exhaust piping 12 connected thereto in the vicinity of the reaction chamber 8, and with valves 2, 4 which are gas switching means for switching a gas flow between the exhaust piping 12 and the reaction chamber 8. The valve 4 provided between the supply piping 11 and the reaction chamber 8 is installed within 20 cm in the upper stream of the reaction chamber 8, a pipe branch point 13 branching to the exhaust piping 12 is provided within 20 cm in the upper stream of the valve 4, and the valve 2 on the exhaust piping 12 is installed within 20 cm from the pipe branch point 13.
申请公布号 JP2003037106(A) 申请公布日期 2003.02.07
申请号 JP20010221420 申请日期 2001.07.23
申请人 HITACHI KOKUSAI ELECTRIC INC 发明人 SASAKI SHINYA;HIROSE YOSHIRO
分类号 C23C16/44;H01L21/31;(IPC1-7):H01L21/31 主分类号 C23C16/44
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