发明名称 Slit lens arrangement for particle beam e.g. for electron or ion beam lithography, uses 2 combined lenses each having electrostatic cylindrical lens and magnetic quadrupole lens
摘要 The slit lens arrangement has 2 combined lenses (1,2) positioned one after the other, each having an electrostatic cylindrical lens (4,5) and a magnetic quadrupole lens (6,7), aligned with their optical axes parallel to one another. The aperture plane (8) of the overall arrangement lies between the 2 combined lenses, with its centre axis defining a point (11) to which the combined lenses are asymmetrical, the optical axis of the quadrupole lenses of the combined lenses displaced in diamtric opposition for adjusting the image size.
申请公布号 DE10136190(A1) 申请公布日期 2003.02.06
申请号 DE20011036190 申请日期 2001.07.25
申请人 CEOS CORRECTED ELECTRON OPTICAL SYSTEMS GMBH;CARL ZEISS LITHOS GMBH 发明人 MUELLER, HEIKO
分类号 G03F7/20;H01J37/10;H01J37/153;H01J37/317;H01L21/027;(IPC1-7):H01J37/10 主分类号 G03F7/20
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