| 摘要 |
<p>A test socket for a semiconductor device includes a guide plate operable to receive the semiconductor device and to maintain electrical terminals of the semiconductor device in registration with electrical terminals of a base. A shell operable to couple to the base and to maintain the guide plate in registration with the electrical terminals of the base, the shell including an aperture in communication with the base through which the guide plate can be inserted and removed when the shell is coupled to the base; and at least one fastener coupled to the shell and operable to maintain the semiconductor device in engagement with the guide plate and to urge the electrical terminals of the semiconductor device in contact with the electrical terminals of the base. A method for operating the test socket is also disclosed.</p> |
