Integrated circuit with trimmer for internal voltage supply for test purposes controlled by test control circuit

摘要

An integrated circuit is supplied from a voltage source (92) through a supply circuit (2). A first internal voltage regulator (10) controls the voltages (V1,V2) for the useful circuit (1). A test control circuit (3) sets the reference voltage for a specific test mode through a trimming voltage value generator (50). This provides a trimming value (TSW) to a reference voltage regulator (30) for trimming the supply voltage to the voltage required for the particular test mode called for.