发明名称 SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURE THEREOF
摘要 A zirconium silicate layer 103 is formed on a silicon substrate 100, a zirconium oxide layer 102 is also formed on the zirconium silicate layer 103, and the zirconium oxide layer 102 is then removed, thereby forming a gate insulating film 104 made of the zirconium silicate layer 103. <IMAGE>
申请公布号 KR20030011084(A) 申请公布日期 2003.02.06
申请号 KR20027016414 申请日期 2002.02.06
申请人 发明人
分类号 H01L29/78;H01L21/28;H01L21/8234;H01L21/8242;H01L29/51 主分类号 H01L29/78
代理机构 代理人
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