发明名称 PRODUCTION METHOD FOR SEMICONDUCTOR DEVICE
摘要 An efficient production method for a semiconductor device which requires fewer production steps. A production method for a semiconductor device having a multi−layer interconnection structure using a dual damascene method, wherein a second interlayer insulation film is removed substantially using a first hard mask as a mask to form an opening, an etching stopper film is removed, and then a first interlayer insulation film is removed to form a via hole in the first interlayer insulation film.
申请公布号 WO03010814(A1) 申请公布日期 2003.02.06
申请号 WO2002JP07452 申请日期 2002.07.23
申请人 TOKYO ELECTRON LIMITED;MAEKAWA, KAORU 发明人 MAEKAWA, KAORU
分类号 H01L21/302;H01L21/033;H01L21/3065;H01L21/311;H01L21/768;(IPC1-7):H01L21/768;H01L21/306 主分类号 H01L21/302
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