发明名称 |
PRODUCTION METHOD FOR SEMICONDUCTOR DEVICE |
摘要 |
An efficient production method for a semiconductor device which requires fewer production steps. A production method for a semiconductor device having a multi−layer interconnection structure using a dual damascene method, wherein a second interlayer insulation film is removed substantially using a first hard mask as a mask to form an opening, an etching stopper film is removed, and then a first interlayer insulation film is removed to form a via hole in the first interlayer insulation film.
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申请公布号 |
WO03010814(A1) |
申请公布日期 |
2003.02.06 |
申请号 |
WO2002JP07452 |
申请日期 |
2002.07.23 |
申请人 |
TOKYO ELECTRON LIMITED;MAEKAWA, KAORU |
发明人 |
MAEKAWA, KAORU |
分类号 |
H01L21/302;H01L21/033;H01L21/3065;H01L21/311;H01L21/768;(IPC1-7):H01L21/768;H01L21/306 |
主分类号 |
H01L21/302 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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