发明名称 One-transistor memory cell configuration and method for its fabrication
摘要 One-transistor memory cell arrangement and method for fabricating it In a method for fabricating a dynamic memory cell in a semiconductor substrate having a trench capacitor 1 and a selection transistor 2 and a semiconductor memory having such a memory cell, a dielectric insulator layer 17, 201 is formed between the selection transistor and the trench capacitor, a first electrode region 203 of the selection transistor essentially being arranged above a block-type inner electrode 102 of the trench capacitor and being connected to said electrode via a contact opening 213 in the dielectric insulator layer, said contact opening being provided with an electrically conductive filling layer 214.
申请公布号 US2003025140(A1) 申请公布日期 2003.02.06
申请号 US20020166813 申请日期 2002.06.11
申请人 KUSTERS KARL HEINZ;TEMMLER DIETMAR 发明人 KUSTERS KARL HEINZ;TEMMLER DIETMAR
分类号 H01L21/8242;H01L27/108;H01L27/12;(IPC1-7):H01L27/108 主分类号 H01L21/8242
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