发明名称 EXPOSURE DEVICE,EXPOSURE METHOD,METHOD OF PRODUCING SEMICONDUCTOR DEVICE,ELECTROOPTIC DEVICE,AND ELECTRONIC EQUIPMENT
摘要 An exposure device (100) having a vertically movable stage device (120) and adapted to effect exposure by projecting a pattern recorded on a hologram mask (130) onto an exposure subject substrate (110) formed with a photosensitive material film (112) and placed on the stage device, comprises a film thickness measuring mechanism (160, 162) that measures the thickness of the photosensitive material film (112), it being arranged that the quantity of exposure light from an exposure source (140) is controlled on the basis of the measured film thickness by a light quantity control mechanism (162). Since a proper quantity of light is set according to the film thickness, a correct pattern can be formed by a single exposure.
申请公布号 WO03010803(A1) 申请公布日期 2003.02.06
申请号 WO2002JP07626 申请日期 2002.07.26
申请人 SEIKO EPSON CORPORATION 发明人 IRIGUCHI, CHIHARU
分类号 G03F7/20;G03F9/00;G03H1/22;(IPC1-7):H01L21/027;G03F1/08 主分类号 G03F7/20
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