发明名称 |
HIGH CAPACITY AND SCANNING SPEED SYSTEM FOR SAMPLE HANDLING AND ANALYSIS |
摘要 |
Disclosed is an apparatus for examining and inspecting at least one sample in order to determine characteristics of the sample having the a support for receiving a compact disc, the compact disc (14) having desposited on a surface thereof at least one sample, inspection means for effecting a physical change in at least one sample, the inspection means positioned for registration with the surface of the compact disc bearing at least one sample; and a traversal mechanism (12) adapted for reciprocating movement, to move the sample in and out of the path of the inspection means. In particular embodiment the apparatus comprises a MALDI mass spectrometer (10), which employs a quadruple mass filter (40). |
申请公布号 |
WO0248678(A3) |
申请公布日期 |
2003.02.06 |
申请号 |
WO2001US49114 |
申请日期 |
2001.12.17 |
申请人 |
THE ROCKEFELLER UNIVERSITY;KRUTCHINSKY, ANDREW;CHAIT, BRIAN |
发明人 |
KRUTCHINSKY, ANDREW;CHAIT, BRIAN |
分类号 |
G01N21/25;G01N35/00;G01N35/10;G01Q30/02 |
主分类号 |
G01N21/25 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|