| 摘要 |
A semiconductor device comprising a memory circuit, a switch for relieving the memory circuit of its failures, and a logic circuit to be tested, facilitates a test of the logic circuit. When a switch control signal (SET) is "1", for example, a switch (200) selects predetermined 1-bit data (=c) from a plurality of 1-bit data (=b) outputted in parallel form from a RAM (100) and outputs it to a logic circuit (300), where c<b.
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