发明名称 AC scan diagnostic method
摘要 Disclosed is an alternating current (AC) scan diagnostic system in which one or a plurality of scan chains are tested by serially propagating predetermined bit patterns through the scan chain and comparing the output against an expected result. The system comprises identification phase, verifications and localization, and a characterization phases. The system is adaptable for use with on-board diagnostics and is adaptable for use with on-product clock generation systems.
申请公布号 US6516432(B1) 申请公布日期 2003.02.04
申请号 US19990469699 申请日期 1999.12.22
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 MOTIKA FRANCO;NIGH PHILLIP J.;SONG PEILIN;DRUCKERMAN HOWARD B.
分类号 G01R31/3185;(IPC1-7):G01R31/28 主分类号 G01R31/3185
代理机构 代理人
主权项
地址