| 摘要 |
A method is provided for efficiently finding a pattern in an image using a full curvilinear model having a plurality of sub-models. Generally, the method includes maximizing the percentage of each segment connected to each vertex of each sub-model, and finding the pattern in the image using the model so-constructed. The invention permits the rapid determination of characteristics, such as dimensions, position, and orientation, of rectilinear and other polygonal objects, and is particularly well-adapted for analyzing images of back-lit objects.
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