| 摘要 |
A method for finding the root causes of the failure of a faulty chip. The faulty chip comprises at least one defect. First, a type-searching step for the defect according to a defect size and a defect type to respectively predict a failure type of a predicted failure region relative to the defect is performed. Then, an influenced-range-searching step for the defect according to a defect location to respectively predict a failure range of a predicted failure region relative to the defect is performed. Finally, the predicted failure region of the defect and a real failure region which was electronically failed and been identified by the faulty chip are compared. If the predicted failure generated from the defect is located in the real failure region, the defect is interpreted to be one of the root causes of the failure of the faulty chip.
|
