发明名称 |
THIN FILM SEMICONDUCTOR DEVICE AND ITS SUBSTRATE, AND MANUFACTURING METHOD THEREOF |
摘要 |
PROBLEM TO BE SOLVED: To provide a thin film semiconductor device wherein a unit circuit having a gate electrode, a source electrode and a drain electrode is formed and arranged in order for every semiconductor single crystal grain formed in a semiconductor thin film, and can operate with high mobility without detrimentally affected by electron scattering or the like in grain boundary during operation, and its substrate and a manufacturing method thereof. SOLUTION: A substrate of a thin film semiconductor device has a semiconductor thin film layer wherein single crystal grain of a large diameter is aligned and arranged regularly by carrying out energy line irradiation in distributed form of energy line strength wherein a maximum value and a minimum value of irradiation energy line are aligned and arranged regularly for each irradiation region in a non-crystalline semiconductor thin film on an insulation substrate layer. A unit electrode is formed by positioning for each single crystal grain of the semiconductor thin film layer by using the substrate. Consequently, a thin film semiconductor device wherein a unit circuit is formed and arranged in order for each single crystal grain can be obtained. |
申请公布号 |
JP2003031497(A) |
申请公布日期 |
2003.01.31 |
申请号 |
JP20010218370 |
申请日期 |
2001.07.18 |
申请人 |
ADVANCED LCD TECHNOLOGIES DEVELOPMENT CENTER CO LTD |
发明人 |
MATSUMURA MASAKIYO;OANA YASUHISA;ABE HIROYUKI;YAMAMOTO YOSHITAKA;KOSEKI HIDEO;KETSUSAKO MITSUNORI |
分类号 |
B65G49/07;H01L21/20;H01L21/336;H01L21/67;H01L21/673;H01L21/677;H01L21/77;H01L21/84;H01L29/786;(IPC1-7):H01L21/20 |
主分类号 |
B65G49/07 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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