发明名称 AUTOMATIC INSPECTION SYSTEM AND DATA COLLECTION SYSTEM
摘要 PROBLEM TO BE SOLVED: To provide an automatic inspection system capable of setting the shortest route and to be easily operated when a repeating base station is added to it. SOLUTION: In the automatic inspection system, a second repeating base station 8 investigates the number of passing stages '-1', '0' with first and second repeating base stations 6, 7 except itself, holds the number of stages '0' obtained by increasing one stage to the minimum number of passing stages '-1' in a routing table RT-8 as the passing number of stages of itself together with an identification code #8 of itself and communicates data by selecting a communication route to be the minimum number of passing stages by using the routing table RT-8.
申请公布号 JP2003030772(A) 申请公布日期 2003.01.31
申请号 JP20010213115 申请日期 2001.07.13
申请人 MITSUBISHI ELECTRIC CORP 发明人 TAKADA YUJI
分类号 G08C17/00;H04B7/15;H04B7/24;(IPC1-7):G08C17/00 主分类号 G08C17/00
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