| 摘要 |
PROBLEM TO BE SOLVED: To provide an apparatus and a method for entirely testing a semiconductor device or a semiconductor wafer capable of constituting a low cost testing unit, easily executing a test and easily confirming a decision result of a non-defective product or a defective product at any time. SOLUTION: The apparatus for entirely testing the semiconductor device or the semiconductor wafer comprises a self-testing circuit mounted at the device 4A; a comparison deciding circuit 32 for testing the device by supplying an applied data signal and a clock signal as well as expected value data from a tester, comparing a test result with the expected value data and deciding whether the device is good or not; and a nonvolatile semiconductor memory cell 33 for storing the decided result.
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