发明名称 MEMORY DEVICE WITH SHORT READ TIME
摘要 The memory device includes a memory array of memory cells, and intersecting word lines and bit lines. At one end of the array, a bank of read/write select switches selectively couples the bit lines to a column write current source, and to a reference potential voltage. A bank of sense amplifier select switches selectively couples the bit lines to a sense amplifier, which is also at the reference potential voltage. Each switch in the bank of sense amplifier select switches may be closed to allow the sense amplifier to sense the binary state of a selected memory cell. The switches in the bank of read/write select switches may each be closed to couple a selected bit line to reference potential voltage. During read operations, the bank of sense amplifier select switches and the bank of read write select switches are operated so that ends of the bit lines are coupled to the reference potential voltage, so that the memory array remains in an equipotential state. Because the memory array remains in the equipotential state, no settling time is required for the memory array due to multiplexing to the sense amplifier. Read operations are therefore faster than in conventional devices.
申请公布号 US2003021145(A1) 申请公布日期 2003.01.30
申请号 US20010910823 申请日期 2001.07.24
申请人 TRAN LUNG T. 发明人 TRAN LUNG T.
分类号 G11C11/15;G11C11/16;(IPC1-7):G11C11/14 主分类号 G11C11/15
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