发明名称 |
SILICON WAFER MANUFACTURING METHOD,SILICON EPITAXIAL WAFER MANUFACTURING METHOD,AND SILICON EPITAXIAL WAFER |
摘要 |
A silicon wafer or silicon epitaxial wafer manufacturing method for adding an excellent−stability IG capability by realizing both a high density of oxygen precipitate and a large size at the stage before the device process. The silicon wafer manufacturing method in which the silicon wafer is heat−treated so as to impart a gettering capability to the silicon wafer comprises at least three steps: a temperature−increasing step A for forming oxygen precipitation nuclei, a temperature−increasing step B for growing the oxygen precipitation nuclei, and a constant temperature−holding step C for further growing the oxygen precipitate larger.
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申请公布号 |
WO03009365(A1) |
申请公布日期 |
2003.01.30 |
申请号 |
WO2002JP05000 |
申请日期 |
2002.05.23 |
申请人 |
SHIN-ETSU HANDOTAI CO.,LTD.;TAKENO, HIROSHI |
发明人 |
TAKENO, HIROSHI |
分类号 |
H01L21/322;(IPC1-7):H01L21/322 |
主分类号 |
H01L21/322 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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