发明名称 SILICON WAFER MANUFACTURING METHOD,SILICON EPITAXIAL WAFER MANUFACTURING METHOD,AND SILICON EPITAXIAL WAFER
摘要 A silicon wafer or silicon epitaxial wafer manufacturing method for adding an excellent−stability IG capability by realizing both a high density of oxygen precipitate and a large size at the stage before the device process. The silicon wafer manufacturing method in which the silicon wafer is heat−treated so as to impart a gettering capability to the silicon wafer comprises at least three steps: a temperature−increasing step A for forming oxygen precipitation nuclei, a temperature−increasing step B for growing the oxygen precipitation nuclei, and a constant temperature−holding step C for further growing the oxygen precipitate larger.
申请公布号 WO03009365(A1) 申请公布日期 2003.01.30
申请号 WO2002JP05000 申请日期 2002.05.23
申请人 SHIN-ETSU HANDOTAI CO.,LTD.;TAKENO, HIROSHI 发明人 TAKENO, HIROSHI
分类号 H01L21/322;(IPC1-7):H01L21/322 主分类号 H01L21/322
代理机构 代理人
主权项
地址