发明名称 |
Abtastkarte und Verfahren zu deren Herstellung |
摘要 |
A probe card transmits high frequency signals between an integrated circuit under test and a semiconductor-testing device. The probe card includes a substrate, a signal transmission path formed on the substrate, a contactor formed on an end portion of the signal transmission path on one side of the substrate, a grounding conductor grounded, and a hole. The contactor is made of a metallic glass material, which shows a nature of viscous fluidity in the supercooled liquid region. The contactor is separated from the substrate over the hole. The contactor elastically contacts a pad of the circuit under test. |
申请公布号 |
DE10192100(T1) |
申请公布日期 |
2003.01.30 |
申请号 |
DE2001192100T |
申请日期 |
2001.05.17 |
申请人 |
ADVANTEST CORP., TOKIO/TOKYO;SHIMOKOUBE, AKIRA;HATA, SEIICHI |
发明人 |
WADA, KOUICHI;TAKOSHIMA, TAKEHISA;MAEDA, YASUHIRO;SHIMOKOUBE, AKIRA;HATA, SEIICHI |
分类号 |
G01R31/26;G01R1/06;G01R1/067;G01R1/073;G01R3/00;H01L21/66;(IPC1-7):G01R1/073 |
主分类号 |
G01R31/26 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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