| 摘要 |
<p>Novel nondestructive analysis method and nondestructive analysis device capable of providing a high-contrast image within an object easily and in one go by setting, when an object (2) is irradiated with homogenous, parallel X-rays (1) to beam a refraction X-ray (3) from the object (2) onto a transmitting crystal analysis element (4a), and the refraction X-ray (3) is separated spectrally into a front-direction refraction X-ray (41a) and a refraction-direction refraction X-ray (42a) by the dynamic refracting action of the transmitting crystal analysis element (4a), the thickness of the transmitting crystal analysis element (4a) to such one that, when no object is present, the intensity of either one of the front-direction refraction X-ray (41a) and the refraction-direction refraction X-ray (42a) is almost zero in comparison with the intensity of the other at the intensity of an X-ray little affected by a directly beamed X-ray.</p> |
