发明名称 Land grid array package mounting apparatus for testing semiconductor device package, has cam for moving bending plate and for bending each contact finger which passes through the bending plate
摘要 A cam (65) moves a bending plate (60) laterally with respect to a support base (25) and a guide plate (21), and bends each contact finger (40) to adjust the distance between free ends (42,44) of the contact fingers. The bending plate has an aperture (61) corresponding to guides (22,26). Several axially elongated contact fingers pass through the aperture of plate. An Independent claim is also included for electrical contact establishment method between package and circuit board.
申请公布号 DE10135517(A1) 申请公布日期 2003.01.30
申请号 DE20011035517 申请日期 2001.07.20
申请人 WAYNE K. PFAFF, IRVING 发明人 WAYNE K. PFAFF, IRVING
分类号 G01R1/04;(IPC1-7):G01R31/28;G01R31/26 主分类号 G01R1/04
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