发明名称 Chemical mechanical polishing slurry containing abrasive particles exhibiting photocatalytic function
摘要 There is provided a method of manufacturing a semiconductor device, including irradiating a chemical mechanical polishing slurry with light on applying a chemical mechanical polishing treatment using the slurry to a polishing section of a target substrate to be polished, the slurry containing a dispersion medium and abrasive particles dispersed in the dispersion medium and exhibiting a photocatalytic function upon irradiation with light.
申请公布号 US2003022502(A1) 申请公布日期 2003.01.30
申请号 US20020201488 申请日期 2002.07.24
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 MATSUI YUKITERU;MINAMIHABA GAKU;YANO HIROYUKI
分类号 B24B57/02;B24B37/00;C09G1/02;C09K3/14;C11D1/66;C11D3/14;C11D11/00;H01L21/304;H01L21/321;H01L21/768;(IPC1-7):H01L21/302;H01L21/461 主分类号 B24B57/02
代理机构 代理人
主权项
地址