发明名称 |
Chemical mechanical polishing slurry containing abrasive particles exhibiting photocatalytic function |
摘要 |
There is provided a method of manufacturing a semiconductor device, including irradiating a chemical mechanical polishing slurry with light on applying a chemical mechanical polishing treatment using the slurry to a polishing section of a target substrate to be polished, the slurry containing a dispersion medium and abrasive particles dispersed in the dispersion medium and exhibiting a photocatalytic function upon irradiation with light. |
申请公布号 |
US2003022502(A1) |
申请公布日期 |
2003.01.30 |
申请号 |
US20020201488 |
申请日期 |
2002.07.24 |
申请人 |
KABUSHIKI KAISHA TOSHIBA |
发明人 |
MATSUI YUKITERU;MINAMIHABA GAKU;YANO HIROYUKI |
分类号 |
B24B57/02;B24B37/00;C09G1/02;C09K3/14;C11D1/66;C11D3/14;C11D11/00;H01L21/304;H01L21/321;H01L21/768;(IPC1-7):H01L21/302;H01L21/461 |
主分类号 |
B24B57/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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