| 摘要 |
PROBLEM TO BE SOLVED: To provide a testing mode control circuit of a semiconductor device that can execute plural kinds of test mode in an arbitrary order. SOLUTION: This control circuit is provided with a shift register, consisting of serially connected resisters of n×m pieces, an input terminal for inputting a data to a register at one end of the registers of n×m pieces, clock signal lines connected to all registers, and an output terminal for outputting a data from a register, at the other end of the registers of n×m pieces. One testing mode is specified by n data held in the n registers. The clock signal line is used to supply a clock signal for moving the data held in the register to the adjoining next register. |
