| 摘要 |
PROBLEM TO BE SOLVED: To solve the problem of a method for measuring the function and timing of a high-speed I/O interface in a semiconductor device requiring, which does not use a high-performance ATE or LSI tester. SOLUTION: This method includes a test data generator which is provided in an output part and generates a test data, a delay circuit which adjust a time difference to set the test data transmitted in the inside of a chip as an expected value, a comparator which is provided in an input part and compares and verifies the test data transmitted in the outside of the chip, and an external wiring, in which an output pin connected with the test data generator is connected with an input pin connected with the comparator.
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