发明名称 METHOD FOR FABRICATING CLADDING LAYER IN TOP CONDUCTOR
摘要 PURPOSE: A method for fabricating cladding layer in top conductor is provided to develop a magnetic memory with flux closure structures that prevent disruptions to magnetization. CONSTITUTION: A method for cladding at least two sides of a top conductor(20) for a memory device(10) in ferromagnetic material(58), the method comprising the steps of: forming a trench with side walls(50) in a coating layer(40) above the memory device; depositing a ferromagnetic material(58) along the side walls of the trench; depositing a conductor material(62) in the trench between the ferromagnetic material along the side walls of the trench whereby a cladding of the ferromagnetic material is formed on two sides of the top conductor.
申请公布号 KR20030009078(A) 申请公布日期 2003.01.29
申请号 KR20020012376 申请日期 2002.03.08
申请人 HEWLETT-PACKARD COMPANY 发明人 ANTHONY THOMAS C.;NICKEL JANICE H.
分类号 G11C11/14;G11C11/15;G11C11/16;H01L21/8246;H01L27/105;H01L27/22;H01L43/08;(IPC1-7):G11C11/15 主分类号 G11C11/14
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