发明名称 |
METHOD FOR FABRICATING CLADDING LAYER IN TOP CONDUCTOR |
摘要 |
PURPOSE: A method for fabricating cladding layer in top conductor is provided to develop a magnetic memory with flux closure structures that prevent disruptions to magnetization. CONSTITUTION: A method for cladding at least two sides of a top conductor(20) for a memory device(10) in ferromagnetic material(58), the method comprising the steps of: forming a trench with side walls(50) in a coating layer(40) above the memory device; depositing a ferromagnetic material(58) along the side walls of the trench; depositing a conductor material(62) in the trench between the ferromagnetic material along the side walls of the trench whereby a cladding of the ferromagnetic material is formed on two sides of the top conductor.
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申请公布号 |
KR20030009078(A) |
申请公布日期 |
2003.01.29 |
申请号 |
KR20020012376 |
申请日期 |
2002.03.08 |
申请人 |
HEWLETT-PACKARD COMPANY |
发明人 |
ANTHONY THOMAS C.;NICKEL JANICE H. |
分类号 |
G11C11/14;G11C11/15;G11C11/16;H01L21/8246;H01L27/105;H01L27/22;H01L43/08;(IPC1-7):G11C11/15 |
主分类号 |
G11C11/14 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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