发明名称 MANUFACTURING METHOD OF TEST PIECE FOR ELECTRON MICROSCOPE OBSERVATION
摘要 PROBLEM TO BE SOLVED: To provide a manufacturing method of a sample sensitive to heat or a solvent for electron microscope observation. SOLUTION: This sample piece 6 is formed as follows: first grooves 4a, 4b are formed on a sample 1; a projection 3 is processed to have a roughly L-shaped section; the widths e, e' of the first grooves 4a, 4b are enlarged; second grooves 5a, 5b are formed orthogonally to the first grooves 4a, 4b; and the projection 3 is removed. Hereby, the sample piece 6 can be manufactured without requiring heat or cleaning by the solvent.
申请公布号 JP2003028761(A) 申请公布日期 2003.01.29
申请号 JP20010209773 申请日期 2001.07.10
申请人 SHARP CORP 发明人 NAKAO YOSHINOBU
分类号 G01N1/04;G01N1/28;(IPC1-7):G01N1/04 主分类号 G01N1/04
代理机构 代理人
主权项
地址
您可能感兴趣的专利