发明名称 |
REFLECTOR INSPECTION DEVICE AND REFLECTOR INSPECTION METHOD |
摘要 |
PROBLEM TO BE SOLVED: To provide an inspection method and an inspection device of a reflector having excellent quality control, and executable efficiently contactlessly. SOLUTION: This device is equipped with a light source for irradiating the reflector to be inspected with light having a prescribed incident angle, multiple light receiving means for detecting respectively multiple components in light, reflected by the reflector at mutually different angles of reflection, and a determination means for determining the quality of a reflection characteristic of the reflector based on light intensity measured by a light intensity measuring means and light intensity detected by the light receiving means. |
申请公布号 |
JP2003028755(A) |
申请公布日期 |
2003.01.29 |
申请号 |
JP20010210304 |
申请日期 |
2001.07.11 |
申请人 |
MATSUSHITA ELECTRIC IND CO LTD |
发明人 |
NISHIYAMA SEIJI;WAKITA HISAHIDE |
分类号 |
G01N21/95;G01M11/00;G02F1/13;G02F1/1335;H04N7/18 |
主分类号 |
G01N21/95 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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