发明名称 REFLECTOR INSPECTION DEVICE AND REFLECTOR INSPECTION METHOD
摘要 PROBLEM TO BE SOLVED: To provide an inspection method and an inspection device of a reflector having excellent quality control, and executable efficiently contactlessly. SOLUTION: This device is equipped with a light source for irradiating the reflector to be inspected with light having a prescribed incident angle, multiple light receiving means for detecting respectively multiple components in light, reflected by the reflector at mutually different angles of reflection, and a determination means for determining the quality of a reflection characteristic of the reflector based on light intensity measured by a light intensity measuring means and light intensity detected by the light receiving means.
申请公布号 JP2003028755(A) 申请公布日期 2003.01.29
申请号 JP20010210304 申请日期 2001.07.11
申请人 MATSUSHITA ELECTRIC IND CO LTD 发明人 NISHIYAMA SEIJI;WAKITA HISAHIDE
分类号 G01N21/95;G01M11/00;G02F1/13;G02F1/1335;H04N7/18 主分类号 G01N21/95
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