发明名称 Semiconductor device manufacturing system and electron beam exposure apparatus
摘要 A semiconductor device manufacturing system for manufacturing a semiconductor device on a wafer, comprising: a first exposure apparatus for exposing the wafer using a light source while moving the wafer with a predetermined interval; and a second exposure apparatus for exposing the wafer by irradiating a plurality of electron beams on the wafer, the plurality of electron beams having an interval of substantially N times or 1/N times, where N is a natural number, of the predetermined interval.
申请公布号 GB2368716(B) 申请公布日期 2003.01.29
申请号 GB20010023771 申请日期 2001.10.03
申请人 * ADVANTEST CORPORATION 发明人 SHINICHI * HAMAGUCHI;HIROSHI * YASUDA;TAKESHI * HARAGUCHI
分类号 G03F7/20;H01J37/305;H01J37/317;H01L21/027 主分类号 G03F7/20
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