发明名称 MANUFACTURING METHOD OF CIRCUIT BOARD AND ITS DEVICE
摘要 PROBLEM TO BE SOLVED: To accurately detect feeble minute-particle scattering light acquired from detection of microscopic particles suspended in a treating chamber. SOLUTION: When applying desired membrane formation/processing treatment to a body to be treated in the treating chamber, the inside of the treating chamber is irradiated with a beam subjected to P-polarization and intensity modulation by the frequency of an excitation source and the frequency different from its integer-fold frequencies through an observation window having inclination forming a Brewster angle to a P-polarized input beam. Backward scattered light scattered by the microscopic particles in the treating chamber is received and imaged by a detection optical system through the same observation window, and a frequency component and a wavelength component of the beam subjected to the intensity modulation are detected from inside the received light signal. The number, the size and the distribution of the microscopic particles are discriminated by using the detected components and the imaged image information.
申请公布号 JP2003028777(A) 申请公布日期 2003.01.29
申请号 JP20010217511 申请日期 2001.07.18
申请人 HITACHI LTD 发明人 NAKANO HIROYUKI;NAKADA TOSHIHIKO;SERIZAWA MASAYOSHI
分类号 C23C16/52;G01N15/02;H01L21/302;H01L21/3065;(IPC1-7):G01N15/02;H01L21/306 主分类号 C23C16/52
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