发明名称 Quality control for laser peening
摘要 A method of testing the operation of a laser peening system includes providing a sensor in a possible laser beam path, applying a transparent overlay material to the sensor, directing a pulse of coherent energy to the sensor through the transparent overlay material to create a shock wave, and determining a characteristic of the created shock wave with the sensor.
申请公布号 US6512584(B1) 申请公布日期 2003.01.28
申请号 US19980106793 申请日期 1998.06.29
申请人 LSP TECHNOLOGIES, INC. 发明人 O'LOUGHLIN MARK E.;CLAUER ALLAN H.;SOKOL DAVID W.;DULANEY JEFFREY L.;TOLLER STEVEN M.
分类号 C21D10/00;(IPC1-7):G01B11/00;B05D3/00;C21D1/54 主分类号 C21D10/00
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