发明名称 Process for preparing a bolometer material and bolometer device
摘要 Crystal phase V2O3 with x=1.5 in VOx is prepared. Such a lower specific resistance than a desired one as a starting film quality is modified to the final desired specific resistance by heating under an oxidizing atmosphere. A protective film for a bolometer material is formed by physical vapor deposition.
申请公布号 US6512229(B2) 申请公布日期 2003.01.28
申请号 US20010799001 申请日期 2001.03.06
申请人 NEC CORPORATION 发明人 SASAKI TOKUHITO
分类号 G01J1/02;C23C14/06;C23C14/08;C30B23/02;G01J5/02;G01J5/20;H01L37/00;(IPC1-7):G01J5/20 主分类号 G01J1/02
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