| 摘要 |
PROBLEM TO BE SOLVED: To provide a method for inspection, capable of deciding a quasi- defective part of pixels in an active matrix display device within short time and with a nondestructive test. SOLUTION: In the method for inspecting the active matrix display device having a plurality of active elements and a plurality of pixels, electric charge is charged in a plurality of the pixels, variation of displaying states of a plurality of the pixels caused by charge or discharge of the electric charge is observed and presence or absence of defects in the respective pixels is decided based on the time required for the variation of the displaying state.
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