| 摘要 |
PROBLEM TO BE SOLVED: To provide a specimen examination device, capable of rapidly and accurately analyzing large number of specimens or a very small amount of a specimen. SOLUTION: Tubular daughter specimen vessels 6 housing the specimens are held on a conveying rack 4. The light emitting part 21, arranged above the daughter specimen vessels 6 emits examination light downwardly and the examination light incident on the daughter specimen serum 30, in each of the daughter specimen vessels 6 from above transmits through the serum downwardly. The transmitted light passes through each of the light transmission holes 10, formed on the conveying rack 4 to be detected by a transmitted light detection part 8, arranged under the conveying rack 4. The light irradiation part 2 and the transmitted light detection part 8 can change over a measurement wavelength to one or more kinds of measurement wavelengths, and by changing over the measurement wavelength in a time-shared manner, the daughter specimen serum 30 is successively measured, on the basis of a plurality of measurement wavelengths different from each other.
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