发明名称 |
SUBSTRATE TREATMENT DEVICE |
摘要 |
PROBLEM TO BE SOLVED: To provide a substrate treatment device with which accurate control is enabled without vibration and the adjustment of a control system is facilitated even in a heat treatment furnace mutually strongly interfering a plurality of detected temperatures provided respectively corresponding to a plurality of heaters. SOLUTION: Measured temperatures in a plurality of zones are respectively compared with temperature setting values c1-c3 of a plurality of heaters h1-h3 by adders d1-d3, the respective compared results are inputted to a plurality of control units f1-f3, power control signals a1-a3 are operated and the ratio of interference in each of zones is multiplied to the respective operated power control signals a1-a3 by an interference ratio operating part 20 so that a final power control signal can be provided.
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申请公布号 |
JP2003022978(A) |
申请公布日期 |
2003.01.24 |
申请号 |
JP20010209875 |
申请日期 |
2001.07.10 |
申请人 |
HITACHI KOKUSAI ELECTRIC INC |
发明人 |
YAMAGUCHI HIDETO;UENO MASAAKI |
分类号 |
F27D19/00;G05B11/32;G05D23/00;H01L21/205;(IPC1-7):H01L21/205 |
主分类号 |
F27D19/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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