发明名称 MOSFET AND METHOD FOR MANUFACTURING THE SAME
摘要 PROBLEM TO BE SOLVED: To provide a MOSFET(metal oxide semiconductor field effect transistor) and a method for manufacturing the MOSFET capable of eliminating the overlap of a gate dielectric and a source/drain region with high reliability. SOLUTION: This method for manufacturing a MOSFET comprises the process of patterning a gate laminate constituted of a gate dielectric 20 arid a gate conductor 30 formed on a substrate 10, and the process of modifying the gate dielectric 20 beneath the gate dielectric 30 so that the gate dielectric 20 can have a central portion and a modified dielectric region 70 adjacent to the central portion. The modified dielectric region 70 has a lower dielectric constant than that of the gate dielectric 20, and the central portion is shorter than the gate conductor 30.
申请公布号 JP2003023155(A) 申请公布日期 2003.01.24
申请号 JP20020127052 申请日期 2002.04.26
申请人 INTERNATL BUSINESS MACH CORP <IBM> 发明人 CLEVENGER LAWRENCE A;HSU LOUIS L;RADENS CARL J;SHEPARD JOSEPH F JR
分类号 H01L21/265;H01L21/28;H01L21/336;H01L21/8247;H01L27/115;H01L29/49;H01L29/51;H01L29/78;H01L29/788;H01L29/792;(IPC1-7):H01L29/78;H01L21/824 主分类号 H01L21/265
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