发明名称 |
MOSFET AND METHOD FOR MANUFACTURING THE SAME |
摘要 |
PROBLEM TO BE SOLVED: To provide a MOSFET(metal oxide semiconductor field effect transistor) and a method for manufacturing the MOSFET capable of eliminating the overlap of a gate dielectric and a source/drain region with high reliability. SOLUTION: This method for manufacturing a MOSFET comprises the process of patterning a gate laminate constituted of a gate dielectric 20 arid a gate conductor 30 formed on a substrate 10, and the process of modifying the gate dielectric 20 beneath the gate dielectric 30 so that the gate dielectric 20 can have a central portion and a modified dielectric region 70 adjacent to the central portion. The modified dielectric region 70 has a lower dielectric constant than that of the gate dielectric 20, and the central portion is shorter than the gate conductor 30.
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申请公布号 |
JP2003023155(A) |
申请公布日期 |
2003.01.24 |
申请号 |
JP20020127052 |
申请日期 |
2002.04.26 |
申请人 |
INTERNATL BUSINESS MACH CORP <IBM> |
发明人 |
CLEVENGER LAWRENCE A;HSU LOUIS L;RADENS CARL J;SHEPARD JOSEPH F JR |
分类号 |
H01L21/265;H01L21/28;H01L21/336;H01L21/8247;H01L27/115;H01L29/49;H01L29/51;H01L29/78;H01L29/788;H01L29/792;(IPC1-7):H01L29/78;H01L21/824 |
主分类号 |
H01L21/265 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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