发明名称 METHOD AND DEVICE FOR POLISHING SEMICONDUCTOR WAFER
摘要 PROBLEM TO BE SOLVED: To inexpensively perform conditioning without damaging the surface of a semiconductor wafer. SOLUTION: This device has a polishing mechanism for pressing and chemically and mechanically polishing a semiconductor wafer 5 on a polishing pad 1 to which a polishing slurry is fed, and a heat radiating device 8 for conditioning the surface of the polishing pad 1 with a plurality of heat sources. Thus, the holding rate of the polishing slurry can be improved and the resistance of contact with the semiconductor wafer 5 can be improved. Further, since diamond grind grains are not used, the surface of the semiconductor wafer 5 is not damaged by the drop of diamond and inexpensive conditioning can be stably performed. Besides, this device is provided with a cleaning brush 9 for cleaning ground chips generated by heat radiation, by friction while using laser light for the heat source of the heat radiating device 8 and a nozzle 10 for washing the surface of the polishing pad.
申请公布号 JP2003022991(A) 申请公布日期 2003.01.24
申请号 JP20010205637 申请日期 2001.07.06
申请人 MATSUSHITA ELECTRIC IND CO LTD 发明人 SHIRAKASHI EIGO
分类号 B24B53/007;B24B53/017;H01L21/304 主分类号 B24B53/007
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