EVALUATING METHOD FOR DATA HOLDING CAPABILITY OF NON- VOLATILE MEMORY, DEVICE THEREFOR, AND LSI HAVING EVALUATION FUNCTION FOR DATA HOLDING CAPABILITY

摘要

PROBLEM TO BE SOLVED: To enable the data holding capability over a long time of a non- volatile memory to be efficiently evaluated in a short time. SOLUTION: After a control section 32 writes data in a memory cell 31 of a non-volatile memory with the rated voltage output of a charge pump circuit 26, the section 32 switches a selector 27, applies the prescribed stress voltage Vcc being lower than the rating voltage to an oxide film O1 between a floating gate FG1 and a drain D1 of the cell and accelerates disappearance of data. The control section 32 discriminates data holding capability by obtaining a holding time of data detected after applying of stress voltage from a detected value of a sense amplifier NTR1 and a timer 33.