发明名称 NORMAL BLOCK DIVISION TYPE INTEGRATED CIRCUIT DEVICE, EXPOSURE MASK DEVICE USED FOR THE SAME, AND MANUFACTURING METHOD THEREFOR
摘要 PROBLEM TO BE SOLVED: To solve the problem that a glass mask used in an exposure process becomes very expensive as the micronization of an integrated circuit device advances, production can not be carried out at a practical cost unless a considerable production quantity is secured and high performance and high functionalities provided by the micronization cannot be utilized fully by a method over a conventional integrated circuit design which is suited to large item small volume production. SOLUTION: Respective function blocks are loaded on respective normal blocks for which the integrated circuit device is normalized in a fixed area. Also, the glass mask is turned into a constitution of a normal block unit with exposure being repeated by each block unit.
申请公布号 JP2003023090(A) 申请公布日期 2003.01.24
申请号 JP20010208472 申请日期 2001.07.09
申请人 SEIKO EPSON CORP 发明人 HASHIMOTO MASAMI
分类号 H01L21/822;H01L21/82;H01L27/04;H01L27/118;(IPC1-7):H01L21/822 主分类号 H01L21/822
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