发明名称 |
NORMAL BLOCK DIVISION TYPE INTEGRATED CIRCUIT DEVICE, EXPOSURE MASK DEVICE USED FOR THE SAME, AND MANUFACTURING METHOD THEREFOR |
摘要 |
PROBLEM TO BE SOLVED: To solve the problem that a glass mask used in an exposure process becomes very expensive as the micronization of an integrated circuit device advances, production can not be carried out at a practical cost unless a considerable production quantity is secured and high performance and high functionalities provided by the micronization cannot be utilized fully by a method over a conventional integrated circuit design which is suited to large item small volume production. SOLUTION: Respective function blocks are loaded on respective normal blocks for which the integrated circuit device is normalized in a fixed area. Also, the glass mask is turned into a constitution of a normal block unit with exposure being repeated by each block unit.
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申请公布号 |
JP2003023090(A) |
申请公布日期 |
2003.01.24 |
申请号 |
JP20010208472 |
申请日期 |
2001.07.09 |
申请人 |
SEIKO EPSON CORP |
发明人 |
HASHIMOTO MASAMI |
分类号 |
H01L21/822;H01L21/82;H01L27/04;H01L27/118;(IPC1-7):H01L21/822 |
主分类号 |
H01L21/822 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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