发明名称 JITTER RESISTANCE MEASURING INSTRUMENT AND METHOD FOR ENABLING EFFICIENT MEASUREMENT OF JITTER RESISTANCE CHARACTERISTIC AND ADEQUATE EVALUATION
摘要 A control unit controls and varies the amplitude of a modulated signal generated by a modulated signal generator each time it changes the combination of the frequency of a clock signal generated by a clock signal generator and the frequency of the modulated signal by controlling the clock signal generator and the modulated signal generator and determines the value indicating the jitter resistance of an object to be measured on the basis of the result of detection by a detection unit of an error of a data signal of a predetermined pattern outputted from the object and on the information on the amplitude of the modulated signal. On receiving the information on the frequency of the clock signal controlled by the control unit and the frequency and amplitude of the modulated signal and the value indicating the jitter resistance, a display unit displays two parameters, i.e., the frequencies of the clock signal and modulated signal, indicating the jitter resistance characteristic of the object on a screen of a display simultaneously.
申请公布号 WO03007578(A1) 申请公布日期 2003.01.23
申请号 WO2002JP07055 申请日期 2002.07.11
申请人 ANRITSU CORPORATION;YANAI, TAKASHI 发明人 YANAI, TAKASHI
分类号 H04L1/20;(IPC1-7):H04L29/14;H04B17/00;H04L1/00 主分类号 H04L1/20
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