发明名称 SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE
摘要 PURPOSE: A semiconductor memory device is provided to be capable of preventing an internal power supply voltage for array from being overshot over a predetermined voltage level. CONSTITUTION: An internal power supply voltage generator circuit(100) generates an internal power supply voltage(VCCA) lower than an external power supply voltage(EVC). The internal power supply voltage(VCCA) is supplied to a load circuit(120) that charges a bit line connected to a memory cell. An overshoot limiting circuit(140) is connected to an output terminal(130) of the internal power supply voltage generating circuit(100). The overshoot limiting circuit(140) discharges charges corresponding to an excessively increased voltage, when the internal power supply voltage(VCCA) of a voltage supply line(130). The overshoot limiting circuit(140) consists of diode-connected NMOS transistors.
申请公布号 KR20030006226(A) 申请公布日期 2003.01.23
申请号 KR20010041923 申请日期 2001.07.12
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KIM, HYEONG DONG;PARK, DEOK HA
分类号 G11C5/14;(IPC1-7):G11C5/14 主分类号 G11C5/14
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